2001
DOI: 10.1116/1.1354980
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Comparison of plasma chemistries and structure-property relationships of fluorocarbon films deposited from octafluorocyclobutane and pentafluoroethane monomers

Abstract: Effect of plasma interactions with low-κ films as a function of porosity, plasma chemistry, and temperature J. Synthesis of organically modified mesoporous silica as a low dielectric constant intermetal dielectricFluorocarbon films are deposited from mixtures of pentafluoroethane ͑PFE͒/argon and octafluorocyclobutane/argon in a parallel plate reactor at pressures of 0.75 and 1 Torr and substrate temperatures between 120 and 240°C. These monomers are compared in terms of plasma dissociation chemistries as well … Show more

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Cited by 30 publications
(23 citation statements)
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“…The main peak at 286.9 eV mostly likely reflects a C-CF bond, 13,17 and the peaks at 288.5 eV and 290.3 eV (better seen in inset) correspond well to C-F and C-F 2 literature values. 17,18 The high concentration of C-CF bonds and the presence of C-F 2 suggest some fluorocarbon deposition from the CF 4 plasma, which also has been reported previously in the literature. 13 We estimate the polymerized fluorocarbon layer to be about 3 nm thick, given that the C-C bond signal disappears at a 60 stage tilt, which reduces the analysis depth by half.…”
Section: Increased Negatively Charged Nitrogen-vacancy Centers In Flusupporting
confidence: 59%
“…The main peak at 286.9 eV mostly likely reflects a C-CF bond, 13,17 and the peaks at 288.5 eV and 290.3 eV (better seen in inset) correspond well to C-F and C-F 2 literature values. 17,18 The high concentration of C-CF bonds and the presence of C-F 2 suggest some fluorocarbon deposition from the CF 4 plasma, which also has been reported previously in the literature. 13 We estimate the polymerized fluorocarbon layer to be about 3 nm thick, given that the C-C bond signal disappears at a 60 stage tilt, which reduces the analysis depth by half.…”
Section: Increased Negatively Charged Nitrogen-vacancy Centers In Flusupporting
confidence: 59%
“…Fluorinated carbon-based (CF x ) thin films have been synthesized by different variants of chemical vapor deposition [17][18][19][20][21] as well as by physical vapor deposition. [22][23][24][25][26][27] CF x films display a low dielectric constant and a low refractive index, 17,19,20 moderate hardness 21,23,25 as well as low friction coefficients, high wear resistance, 23 and biocompatibility.…”
Section: Introductionmentioning
confidence: 99%
“…In order to tailor the properties of nanostructured carbon-based thin films for desired technological applications, other elements such as nitrogen, 4,[8][9][10] phosphorus, [11][12][13] sulfur 8,[14][15][16] and fluorine [17][18][19][20][21][22][23][24][25] are often incorporated in the carbon matrix at concentrations between 0-30 at.%.…”
Section: Introductionmentioning
confidence: 99%
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“…Fluorinated carbon-based thin films 5 have been largely studied in the last fifteen years due to their low dielectric constant and low refractive index [104][105][106], moderate hardness [55,56,107], low surface energy, high wear resistance and low friction coefficient [107,108], chemical inertness, and biocompatibility [55]. These films have been synthesized by different vapor phase deposition methods with resulting structures of amorphous nature (e.g., DLC and polymer-like) [54][55][56][57][104][105][106][107][109][110][111].…”
Section: Carbon Fluoride Cf Xmentioning
confidence: 99%