Multiparameter stacking schemes like the common-reflection-surface (CRS) stack have shown to yield reliable results even for strongly noise-contaminated data. This is particularly useful for low-amplitude events such as diffractions, but also in passive seismic settings. As a by-product to a zero-offset section with a significantly improved signal-to-noise ratio, the CRS stack also extracts a set of physically meaningful wavefront attributes from the seismic data, which are a powerful tool for further data analysis. These wavefront attributes describe the properties of two conceptual wavefronts emerging at the surface. While these wavefronts are hypothetical in the reflection case, for diffractions and passive seismic events the wavefront attributes describe the actually measured wavefront. Although the attributes are extracted locally from the raw data and vary laterally along the events, an analysis of their local similarity allows the global identification of measurements that stem from the same diffractor or passive source, that is, from the same location in the subsurface. In this work, we present a fully unsupervised scheme to globally identify and tag diffractions in simple and complex data by means of local attribute similarity. Due to the fact that wave propagation is a smooth process and due to the assumption of only local attribute similarity, this approach is not restricted to settings with moderate subsurface heterogeneity. We demonstrate by means of a simple example that event tagging is an essential ingredient for, for example, focusing analysis in wavefront tomography and for uncertainty analysis of velocity and localization for diffraction-only data. Although not explicitly shown in this work, the proposed method is equally applicable to passive seismic data.