2018
DOI: 10.1007/978-3-319-99241-9_10
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Comparison of Search-Based Algorithms for Stress-Testing Integrated Circuits

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Cited by 2 publications
(3 citation statements)
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“…During the historical period, the IC was expanded with an increasing degree of functionality and other built-in components that became an integral part of this chip. The comprehensive functioning of the system is unstable due to the complexity and impossibility of testing the constituent components at a deep level [45].…”
Section: Modern Integrated Circuits (Ics)mentioning
confidence: 99%
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“…During the historical period, the IC was expanded with an increasing degree of functionality and other built-in components that became an integral part of this chip. The comprehensive functioning of the system is unstable due to the complexity and impossibility of testing the constituent components at a deep level [45].…”
Section: Modern Integrated Circuits (Ics)mentioning
confidence: 99%
“…The main reasons for their application are reflected in certain disadvantages and advantages of modern ICs [45]:…”
Section: Modern Integrated Circuits (Ics)mentioning
confidence: 99%
See 1 more Smart Citation