Comparison of supply noise and substrate noise reduction in SiGe BiCMOS and FDSOI processes

Cheong, Wai Leng; Owens, Brian E.; Pham, Hui En; Hanken, Christopher; Le, Jim; Fiez, T.S.; Mayaram, K.

doi:10.1109/isqed.2009.4810279

2009 10th International Symposium on Quality Electronic Design 2009

DOI: 10.1109/isqed.2009.4810279

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Comparison of supply noise and substrate noise reduction in SiGe BiCMOS and FDSOI processes

Wai Leng Cheong

Brian E. Owens

Hui En Pham

et al.

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Comparison of supply noise and substrate noise reduction in SiGe BiCMOS and FDSOI processes

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References 15 publications

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