Comparison of the Josephson voltage standards of the NIM (China) and the BIPM

Reymann, D.; Xue, Shimin; Liu, R M; Li, H H; Gao, Jianjun; Zhou, Yiling; Witt, Thomas J.

doi:10.1088/0026-1394/33/5/6

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Uncertainties and Results1

Frequency Accuracy and Stability1

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1998

2010

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Cited by 6 publications

(2 citation statements)

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“…As previously observed [4], the values obtained from the simple unweighted means of N and R do not differ significantly from those obtained using a weighted mean. However, the calculated uncertainties of the simple mean values are much larger due to the effects of the EMI.…”

Section: Uncertainties and Resultssupporting

confidence: 83%

Comparison of the Josephson voltage standards of the IEN and the BIPM

Reymann¹,

Witt²,

Andreone³

et al. 1998

Metrologia

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Section: Uncertainties and Resultssupporting

confidence: 83%

Comparison of the Josephson voltage standards of the IEN and the BIPM

Reymann¹,

Witt²,

Andreone³

et al. 1998

Metrologia

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“…This evaluation would give a standard uncertainty of a few parts in 10 10 , which is rather pessimistic. Therefore, we have set up an experiment based on a heterodyne technique (cf figure 4) to characterize the frequency stability of the Gunn diodes stabilized with the frequency counter [18].…”

Section: Frequency Accuracy and Stabilitymentioning

confidence: 99%

Direct comparison between a programmable and a conventional Josephson voltage standard at the level of 10 V

et al. 2008

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A Josephson voltage standard (JVS) from the BIPM, incorporating a PTB 10 V programmable array, has been compared with a JVS from the LNE, operating with a conventional hysteretic array. The metrological characteristics of both JVSs were carefully studied. We report on the experiments performed for this comparison and on the uncertainty components. The final comparison result is (U PJVS − U JVS )/ U JVS = −3.2 × 10 −11 with a relative total combined standard uncertainty of 6.1 × 10 −11 (k = 1).

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