2019
DOI: 10.1364/oe.27.033459
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Comparison of three focus sensors for optical topography measurement of rough surfaces

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Cited by 10 publications
(9 citation statements)
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“…The data detection and then minimization of the influence of the measurement errors that occurred during the surface texture measurement process seems to be a compelling issue, especially when accurate assessments of surface topography parameters are reasonably required. The errors that occur while measurement proceeds are often defined as a noise [ 3 ], e.g., instrument or instrument white [ 4 ], random or random height [ 5 ], phase [ 6 ], signal-to-ratio [ 7 ], RMS height [ 8 ] or, simply, measurement noise [ 9 ]. Furthermore, the process of removal or reduction of those types of measurement uncertainty is defined as a denoising procedure [ 10 ].…”
Section: Introductionmentioning
confidence: 99%
“…The data detection and then minimization of the influence of the measurement errors that occurred during the surface texture measurement process seems to be a compelling issue, especially when accurate assessments of surface topography parameters are reasonably required. The errors that occur while measurement proceeds are often defined as a noise [ 3 ], e.g., instrument or instrument white [ 4 ], random or random height [ 5 ], phase [ 6 ], signal-to-ratio [ 7 ], RMS height [ 8 ] or, simply, measurement noise [ 9 ]. Furthermore, the process of removal or reduction of those types of measurement uncertainty is defined as a denoising procedure [ 10 ].…”
Section: Introductionmentioning
confidence: 99%
“…The calculated ultrathin metalens ( Figure 12 a) with a high numerical aperture and a small diameter, which alone replaces the entire optical scheme in Figure 8 a (and also replaces a focusing lens with a numerical aperture close to 1), may serve as a prototype of a compact focusing sensor for optical topography measurement of rough surfaces [ 37 ].…”
Section: Resultsmentioning
confidence: 99%
“…i cos 2φ −i sin 2φ sin 2φ cos 2φ = e iπ/4 e iπ/4 0 0 e −iπ/4 cos 2φ − sin 2φ sin 2φ cos 2φ . (20) The calculated ultrathin metalens (Figure 12a) with a high numerical aperture and a small diameter, which alone replaces the entire optical scheme in Figure 8a (and also replaces a focusing lens with a numerical aperture close to 1), may serve as a prototype of a compact focusing sensor for optical topography measurement of rough surfaces [37]. The metalens transmission function (Figure 12a) without the Fresnel zone plate is described by the Jones matrix, which is the product of the rotation matrix of the linear polarization vector, the angle 2φ, and the matrix of a quarter-wave plate, which converts the linear polarization to elliptical or circular polarization.…”
Section: R(φ) =mentioning
confidence: 99%
“…The errors that occur while the measurement process takes place are often defined as noise [18]. From all of the studied types of measurement noises, e.g., instrument or instrument white [19], random [20], phase [21], signal-to-ratio [22] or, simply, the measurement noise [23], the high-frequency domain (high-frequency measurement noise [24]) is most commonly studied in recent research.…”
Section: Introductionmentioning
confidence: 99%