Compendium of Single Event Effects Radiation Test Results from Ball Aerospace &amp;#x00026; Technologies Corp.

Bird, John; Davies, Rob; DuVal, David; Gasdia, Forrest; Hamp, Charlie; Horton, R.; Koval, T.; Lee, Jennifer; Marino, Kristin; O’Connor, Timothy; Rezgui, S.; Chen, Dakai; Casey, Megan C.; Kim, Hak S.; Phan, Anthony M.

doi:10.1109/redw.2009.5336320

2009 IEEE Radiation Effects Data Workshop 2009

DOI: 10.1109/redw.2009.5336320

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Compendium of Single Event Effects Radiation Test Results from Ball Aerospace & Technologies Corp.

John Bird

Rob Davies

David DuVal

et al.

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Compendium of Single Event Effects Radiation Test Results from Ball Aerospace & Technologies Corp.

Cited by 4 publications

References 5 publications

Heavy Ion and Proton Induced Radiation Effects on Differential Bus Transceiver Microcircuits

Heavy Ion and Proton Induced Radiation Effects on Differential Bus Transceiver Microcircuits

Compendium of Total Ionizing Dose Radiation Test Results from Ball Aerospace & Technologies Corp.

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Compendium of Single Event Effects Radiation Test Results from Ball Aerospace &#x00026; Technologies Corp.

Cited by 4 publications

References 5 publications

Heavy Ion and Proton Induced Radiation Effects on Differential Bus Transceiver Microcircuits

Heavy Ion and Proton Induced Radiation Effects on Differential Bus Transceiver Microcircuits

Compendium of Total Ionizing Dose Radiation Test Results from Ball Aerospace &#x00026; Technologies Corp.

Recent Results for PowerPC Processor and Bridge Chip Testing

Contact Info

Product

Resources

About

Compendium of Single Event Effects Radiation Test Results from Ball Aerospace & Technologies Corp.

Compendium of Total Ionizing Dose Radiation Test Results from Ball Aerospace & Technologies Corp.