“…In the XRD characterization process, Cu Kα radiation was used and the acquisition step and scan rate were set to 0.02°and 0.2°min −1 , respectively. The required data in an angular range of 2θ = 10-90°was used for the Rietveld refinement using the software Fullprof Suite 22,24 to obtain the crystal parameters of V-spinel crystals. In the refinement process, the Pseudo-Voigt profile function and the crystal structure model of the standard card Fe 2.5 Ti 0.5 O 4 (PDF: 75-1376) with the Fd3 ¯m space group was used and the order of refinement steps was the global parameters and the phase parameters, which included background coefficients, zero coefficient, scale coefficient, cell parameters, FWHM parameters, shape parameters, atomic sites and occupancies.…”