“…Compared to SAXS mode, the X-ray beam in GISAXS mode hits the sample with a very small incident angle (usually smaller than 1 ), exploiting the finite penetration depth of totally reflected X-rays into the material; this geometry is extremely surface sensitive and allows us to investigate thin films down to the nanometre scale in thickness (Mü ller- Buschbaum et al, 1999Buschbaum et al, , 2000. Because high brilliance and collimation of the X-ray beam are required, most in situ GISAXS experiments are performed at synchrotron radiation facilities, such as SSRF, BSRF and DESY (Roth et al, 2007;Papadakis et al, 2008;Di et al, 2010;Cheng et al, 2011;You et al, 2011;Zhong et al, 2011Zhong et al, , 2013Zhang et al, 2013Zhang et al, , 2014aZhang et al, , 2014bZhao et al, 2014). Much work on modified synchrotron GISAXS facilities has been reported (Roth et al, 2006;Jerkily et al, 2013;Ogawa et al, 2013;Li et al, 2014).…”