We propose an approach for efficient modeling of thin carbon nanotube layers for full-wave device simulations without increasing the number of simulation mesh cells. A surface impedance, used in computer simulations, is calculated from the dielectric constant of the material. The dielectric constant is modeled by a Drude-Lorentz resonance, fitted to experimental results. The approach allowed to study the nanotube-induced losses and finite-size resonance effects in optically-controlled, dielectric rod waveguide-based phase shifters. The correctness of the model was verified both by the simulated and the measured S-parameters in the W-band.