1999
DOI: 10.1039/a809088b
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Complex pattern formation by phase separation of polymer blends in thin films

Abstract: During spin coating of very thin Ðlms from a solution of incompatible polymers quite interesting lateral structures are forming. From scanning force microscopy (SFM) and X-ray reÑectometry it is concluded that a surface height modulation is present, which reÑects at the surface the phase separated morphology of the blend in the Ðlm. Those structures depend critically on di †erent parameters like relative concentration of the components, spinning parameters, solvent quality or compatibility of the blend. In ble… Show more

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Cited by 94 publications
(120 citation statements)
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“…Laterally separated phase domains present in solvent-quenched thin films (and corresponding to column-like morphologies in temperature-quenched samples with flat surfaces) are always accompanied by free surface undulations [39,[54][55][56][57][58][59][60][61][62]. Different theories, referring to various solvent effects, try to account for this phenomenon [59,[61][62].…”
Section: B Solvent Quenchmentioning
confidence: 99%
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“…Laterally separated phase domains present in solvent-quenched thin films (and corresponding to column-like morphologies in temperature-quenched samples with flat surfaces) are always accompanied by free surface undulations [39,[54][55][56][57][58][59][60][61][62]. Different theories, referring to various solvent effects, try to account for this phenomenon [59,[61][62].…”
Section: B Solvent Quenchmentioning
confidence: 99%
“…5a). Such solvent quench [39,[54][55][56][57][58][59][60] accompanies the spin-casting process ( Fig. 5b-f) [38].…”
Section: B Solvent Quenchmentioning
confidence: 99%
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“…The used cantilevers were made from microfabricated silicon (Nanosen-sors). Measurements at several sample positions were performed with scan areas between 1 x 1 µm and 20 x 20 µm" To get a less pictoral view on the surface, the topographies observed by SFM were analyzed by a Fourier transformation [29] A better signal-to-noise ratio was reached in an additional next step with the calculation of the radially averaged power spectral density (PSD) from the Fourier transform: PSD = 1/2π|F(q)| 2 .If the PSD spectrum contained a peak, the peak position s* was extracted using a fit of a Gaussian line shape to the PSD [30]. From this position s* the dominant lateral length scale S* in the surface topography was then calculated:…”
Section: Scanning Force Microscopymentioning
confidence: 99%
“…in optics or sensors (Walheim et al, 1999). The morphology is altered and tailored by changing the ratio of the components in the blend (Gutmann et al, 1999). The characteristic structural size is modified through the amount of material deposited on the solid support and by the preparation technique used.…”
Section: Introductionmentioning
confidence: 99%