2004 IEEE MTT-S International Microwave Symposium Digest (IEEE Cat. No.04CH37535)
DOI: 10.1109/mwsym.2004.1338959
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Complex permittivity measurements at variable temperatures of low loss dielectric substrates employing split post and single post dielectric resonators

Abstract: A split post dielectric resonator in a copper enclosure and a single post dielectric resonator in a cavity with superconducting cnd-plates have been constructed and used for the complex permittivity measurements of single crystal substrates. (La,Sr)(AI,Ta)03, LaAJ0 3 , MgO and quartz substrates have been measured at temperatures from 20 K to 300 K in the split post resonator and from 15 K to 80 K in the single post resonator. The TE oio mode resonant frequencies and unloaded Qu-factors of the empty resonators … Show more

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Cited by 16 publications
(7 citation statements)
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“…The resonant frequencies and quality factors of the split post dielectric resonator are measured with and without a testing material (Figure 10) by using a vector network analyzer. The real part of the complex relative permittivity (ε r,m ) can then be calculated from the shift in the resonant frequency by using the formula [90]:…”
Section: Split Post Dielectric Resonator Methodsmentioning
confidence: 99%
See 1 more Smart Citation
“…The resonant frequencies and quality factors of the split post dielectric resonator are measured with and without a testing material (Figure 10) by using a vector network analyzer. The real part of the complex relative permittivity (ε r,m ) can then be calculated from the shift in the resonant frequency by using the formula [90]:…”
Section: Split Post Dielectric Resonator Methodsmentioning
confidence: 99%
“…where f w and f wo are the resonant frequencies with and without sample, respectively; h is the sample thickness; and K ε is a function of ε r,m and h, and can be computed by an iterative method [90]. The loss tangent (tan δ) can be obtained from the measured quality factors by using the expression [90]:…”
Section: Split Post Dielectric Resonator Methodsmentioning
confidence: 99%
“…Employing “dielectric resonator” techniques (using the whispering gallery and quasi- modes) several low loss single-crystal dielectrics have been measured [ 38 , 46 , 47 , 48 , 49 , 50 , 51 , 52 , 53 , 54 , 55 , 56 , 57 ]. In Table 1 , results of room temperature permittivity and the thermal coefficient of permittivity measurements using these techniques for several single-crystal dielectrics are presented.…”
Section: Microwave Measurements Of Dielectricsmentioning
confidence: 99%
“…One of the systems, which enable measuring in a wide frequency band, is presented in Ref. [22] and in Fig. 5a.…”
Section: The Case Of Normal Incidence Of Electromagnetic Wave On the mentioning
confidence: 99%