2018
DOI: 10.1016/j.jelechem.2017.12.004
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Complexing agent-assisted highly dense CuInSe2 thin films prepared by one-step electrochemical deposition

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Cited by 7 publications
(1 citation statement)
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“…The crystallographic plane (112) is the prominent diffraction plane, indicating that the single crystal growth has occurred along the (112) direction [21][22].The lattice parameter was calculated to be 5.77 and 11.74 A˚ which is directly related to the anion position displacement in chalcopyrites was found to be near to 1 (The tetragonal deformation parameter η = c/2a) [23,24] confirming CuInSe 2 phase.. The size of the crystallites D in the grains can be estimated by the Debye-Scherrer formula [20]:…”
Section: Structural Propertiesmentioning
confidence: 97%
“…The crystallographic plane (112) is the prominent diffraction plane, indicating that the single crystal growth has occurred along the (112) direction [21][22].The lattice parameter was calculated to be 5.77 and 11.74 A˚ which is directly related to the anion position displacement in chalcopyrites was found to be near to 1 (The tetragonal deformation parameter η = c/2a) [23,24] confirming CuInSe 2 phase.. The size of the crystallites D in the grains can be estimated by the Debye-Scherrer formula [20]:…”
Section: Structural Propertiesmentioning
confidence: 97%