1998
DOI: 10.1016/s0921-5107(98)00113-5
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Compositional analysis and depth profile studies on undoped and doped tin oxide films prepared by spray technique

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Cited by 90 publications
(42 citation statements)
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“…[33] Afify et al and Agashe et al reported that the (200) plane is particularly sensitive to substrate temperature which controls the growth of the films. [34,35] Belanger et al prepared FTO films by CVD and observed that for films with a thickness of around 0.4 mm the dominant planes were found to be the (200), (400), (301) and (211).…”
Section: Resultsmentioning
confidence: 99%
“…[33] Afify et al and Agashe et al reported that the (200) plane is particularly sensitive to substrate temperature which controls the growth of the films. [34,35] Belanger et al prepared FTO films by CVD and observed that for films with a thickness of around 0.4 mm the dominant planes were found to be the (200), (400), (301) and (211).…”
Section: Resultsmentioning
confidence: 99%
“…The O1s peak centered at 531.0 eV is given in Fig.1(c). According to Amanullah's report [10], generally, the O1s peak has been observed in the binding energy region of 529-535 eV. The peak around 529-530 eV is ascribed to lattice oxygen.…”
Section: Methodsmentioning
confidence: 95%
“…According to Amanullah et al [21], generally, the O1s peak had been observed in the binding energy region of 529-535 eV and the peak around 529-530 eV is ascribed to lattice oxygen [22]. For chemisorbed O 2 on the surface, the binding energy ranged from 530.0 to 530.9 eV.…”
Section: Methodsmentioning
confidence: 98%