2024
DOI: 10.1007/s13538-024-01444-8
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Comprehensive Analysis of Lead-Free Perovskite (CsSn0.5Ge0.5I3) Solar Cell: Impact of Active Layer Thickness and Defect Density

Sarita Yadav,
Saral K Gupta,
C. M. S. Negi
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“…A decrease in the shunt resistance indicates the enhanced leakage caused by the increase in charge recombination due to the increasing trap density. Consequently, degrades the collection efficiency and thus reduces the FF [42].…”
Section: Resultsmentioning
confidence: 99%
“…A decrease in the shunt resistance indicates the enhanced leakage caused by the increase in charge recombination due to the increasing trap density. Consequently, degrades the collection efficiency and thus reduces the FF [42].…”
Section: Resultsmentioning
confidence: 99%