Comprehensive Intraplant and Interplant Correlation of Photometric Measurements for Avionics LCDs

Abstract

Honeywell has developed and implemented a comprehensive intraplant and interplant colorimeter certification method with traceability to NIST standards for inspection of avionics LCDs. To perform effective interplant correlation of optical measurements, special‐purpose hardware was specified, designed, and built. Since the implementation of these procedures, increases in interplant correlation have helped to dramatically reduce the cycle time for LCD glass; and intraplant correlation has improved to the level where grouping in CIELuv space by colorimeters is no longer apparent.