Comprehensive separate extraction of parasitic resistances in MOSFETs considering the gate bias-dependence and the asymmetric overlap length

Kim, Junyeap; Yoo, Hanbin; Lee, Heesung; Kim, Seong Kwang; Choi, Sung-Jin; Kim, Dae Hwan; Kim, Dong Myong

doi:10.1016/j.microrel.2018.04.011

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Comprehensive separate extraction of parasitic resistances in MOSFETs considering the gate bias-dependence and the asymmetric overlap length

Cited by 7 publications

References 15 publications

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