2018 IEEE 68th Electronic Components and Technology Conference (ECTC) 2018
DOI: 10.1109/ectc.2018.00251
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Comprehensive Study on 2.5D Package Design for Board-Level Reliability in Thermal Cycling and Power Cycling

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Cited by 40 publications
(4 citation statements)
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“…If the temperature distribution inside the chip package is not uniform, the signal transmission characteristics of the chip will be influenced, thereby affecting the life and reliability of the electronic device. Additionally, because of the differences in the thermal expansion coefficient between chip packaging materials [31][32][33][34][35][36][37][38][39][40][41][42][43][44], different materials have different degrees of thermal expansion and contraction under the influence of temperature. This results in additional stress and strain inside the electronic components, especially inside solder joints.…”
Section: Fatigue Failure Factors Of Bga Solder Jointsmentioning
confidence: 99%
“…If the temperature distribution inside the chip package is not uniform, the signal transmission characteristics of the chip will be influenced, thereby affecting the life and reliability of the electronic device. Additionally, because of the differences in the thermal expansion coefficient between chip packaging materials [31][32][33][34][35][36][37][38][39][40][41][42][43][44], different materials have different degrees of thermal expansion and contraction under the influence of temperature. This results in additional stress and strain inside the electronic components, especially inside solder joints.…”
Section: Fatigue Failure Factors Of Bga Solder Jointsmentioning
confidence: 99%
“…Lai used the computational fluid dynamics (CFD) model to analyze the temperatures of solder balls of a BGA assembly during the reflow soldering process (Lai et al, 2021). Shao used The current issue and full text archive of this journal is available on Emerald Insight at: https://www.emerald.com/insight/0954-0911.htm the CFD model to obtain the working status temperature distribution of a 2.5 D package and mapped it to the finite element analysis model to observe component warpage (Shao et al, 2018). Deng used the CFD model to predict the temperature distribution of a system in package assembly during the reflow soldering process (Deng et al, 2014).…”
Section: Introductionmentioning
confidence: 99%
“…The authors proved that maximum warpage and the remaining residual warpage in the components can be predicted accurately. Shao et al (2018) studied a PCB model with 2.5D packages to determine solder fatigue life. The authors simulated several parameters to improve power-cycling life prediction for and the temperature results of the finite element model.…”
Section: Introductionmentioning
confidence: 99%