A face-on
oriented thin film of poly(3-hexylthiophene) (P3HT) is
suitable for an organic semiconductor layer in a photovoltaic device,
and thus analysis of the film structure in terms of molecular orientation
is crucial. Although the face-on film often has a poor crystallinity,
diffraction techniques have long been employed for the structural
analysis, and only very minor crystal parts have been discussed. In
our previous study, P3HT was revealed to have a uniquely oriented
structure even in an amorphous film by using p-polarized multiple-angle
incidence resolution spectrometry (pMAIRS), which is powerful to analyze
the molecular orientation, crystallinity, and the conjugation length
of P3HT. With the best use of the potential of pMAIRS, in the present
study, the controlling mechanism of the molecular orientation of P3HT
correlated with the crystallinity in a spin-coated thin film is revealed.
As a result, by employing a high-spin speed at 8000 rpm, a highly
face-on oriented thin film having a very low crystallinity is obtained,
which readily reveals that the face-on component has a strong correlation
with the amorphous aggregates.