2014
DOI: 10.1016/j.ijheatmasstransfer.2014.06.043
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Computation of thermal properties of a copper–copper nano interface structure using a MD–ISE–FE method

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Cited by 3 publications
(2 citation statements)
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“…With the development of highly integrated electronic devices, the size of electronic devices is more close to nanoscale [1][2][3][4][5][6][7][8][9][10][11][12][13][14][15][16][17][18][19]. The thermal conductivity of GNRs can reach up to 5000 W/mK at room temperature, and the good thermal conductivity and electrical properties make it an ideal material for the next generation of integrated circuits [1].…”
Section: Introductionmentioning
confidence: 99%
“…With the development of highly integrated electronic devices, the size of electronic devices is more close to nanoscale [1][2][3][4][5][6][7][8][9][10][11][12][13][14][15][16][17][18][19]. The thermal conductivity of GNRs can reach up to 5000 W/mK at room temperature, and the good thermal conductivity and electrical properties make it an ideal material for the next generation of integrated circuits [1].…”
Section: Introductionmentioning
confidence: 99%
“…This method has many merits, but it proved to be inefficient and imprecise. Based on the MD/FE coupled multiscale method, a more accurate MD/ISE/FE method was proposed by Yang et al by introducing the interface stress element (ISE) into the MD/FE multiscale method to improve the calculation accuracy. Two coupling regions are present between the two different models, which are known as the handshake regions.…”
Section: Thermal Resistance At the Interface Between Contacting Matermentioning
confidence: 99%