2021
DOI: 10.1088/1361-6463/ac1a9e
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Computational analysis of direct current breakdown process in SF6 at low pressure

Abstract: The breakdown of SF6 gas at low pressure is of vital importance to both aerospace and microelectronics industries. However, the breakdown characteristics of SF6 in direct current at low pressure are still seldom studied. In this work, one-dimensional implicit particle-in-cell/Monte-Carlo collision algorithm is used to study the entire direct current breakdown process of low-pressure SF6. The ion-molecule collision, recombination, and external circuit are considered in the model. According to the results, the b… Show more

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Cited by 12 publications
(17 citation statements)
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“…For DC discharge, a changeable ballast (or current-limiting resistor) is usually used as the external circuit, which is connected in series between the DC power supply and the electrode to protect the whole circuit [35][36][37]. In this work, similar to [37,38], a ballast resistor is used as the external circuit, shown in the left figure of figure 1, which is connected between the negative pole of the DC power source and the electrode of the discharge chamber. The positive pole of the power source and another electrode is grounded.…”
Section: External Circuitmentioning
confidence: 99%
“…For DC discharge, a changeable ballast (or current-limiting resistor) is usually used as the external circuit, which is connected in series between the DC power supply and the electrode to protect the whole circuit [35][36][37]. In this work, similar to [37,38], a ballast resistor is used as the external circuit, shown in the left figure of figure 1, which is connected between the negative pole of the DC power source and the electrode of the discharge chamber. The positive pole of the power source and another electrode is grounded.…”
Section: External Circuitmentioning
confidence: 99%
“…Compared to argon, discharges in electronegative gases such as CF 4 are quite different [9,[11][12][13][14]. This has been confirmed by our recent work on dc breakdown in SF 6 [30]. As an important gas used in plasma etching for the semiconductor industry, the breakdown process of CCP discharge in CF 4 has barely been studied yet.…”
Section: Introductionmentioning
confidence: 69%
“…Grounded in first-principles-based particle kinetic simulation, this method allows larger spatio-temporal steps compared to explicit methods [48,[74][75][76], diagnoses the dynamic breakdown evolution, and records plasma parameter evolution, effectively characterizing non-equilibrium and non-local plasma dynamics. Its effectiveness has been demonstrated in observing parameters governing DC breakdown in SF 6 at low pressure [77] and the breakdown process of DC-driven micro-discharges sustained by thermionic emission at atmospheric pressure [16]. Utilizing the coupled MCC model [78], this approach considers various collision processes, including elastic scattering, excitation, and ionization collisions for both electrons and neutral atoms, charge exchange, and elastic scattering for ions and neutral atom collisions, with cross-sectional data sourced from referenced literature [61].…”
Section: Methodsmentioning
confidence: 99%