Computational modeling of stochastic processes in electron amplifiers

Mathematical and Computer Simulation of Visual Acuity in Imaging Devices

“…2 shows a cross section of such device. The MCP is a thin plate made up of a large number of single parallel channels, each of which acts as an electron multiplier [2], [4], [6]. For each primary electron entering a channel, a large pulse of electrons will exit as a result of multiple collisions of both primary and secondary electrons with the inner secondary-emission layer.…”

“…A computational method for simulation of stochastic processes of an electron multiplication in microchannel electron amplifiers, developed by the author [4], is used for investigation of the noise factor. The method is based on 3D Monte Carlo (MC) simulations and theorems about serial and parallel amplification stages proposed by the author.…”

“…The Poisson distribution at the beginning of the channel changes to the negative exponential function. The length of a channel, where the amplitude distribution changes from the peaked one to the negative exponential distribution, is determined in [4] and called 'the effective length of a channel', which is equal half of the channel's length.…”

“…Equations (11) constitute the theorem of parallel amplification paths [4]. In the model the multiplication process of a single electron coordinate directed along the channel axis and measured from its beginning) is simulated by 3D MC methods in a homogeneous field along the effective channel length.…”

“…Such properties are usually characterized by the modulation-transfer-function (MTF) and by the value of noise, produced by the device. The MTF describes the resolution over the image area of an image device [2]- [4], and gives the dependence of the output contrast on the spatial frequency. The noise factor F, which is a measure of the loss of available information, can be written as [5]: respectively.…”