Computational Simulation of a Field-Induced Charged Board Event Test Bench Using Transient Analysis

Abstract

This study reported the computational simulation of a test bench prototype for a field-induced charged board event (FICBE) by using transient analysis. The discharge probe and its stray impedance were experimentally measured using an RLC circuit analyzed in the transient mode. The simulation revealed that the stray impedance could distort the FICBE discharge current waveform, which is very-high-peak-current, fast-rise-time waveform, and leads to noncompliance in test bench qualification. Furthermore, adding a ferrite bead could shape the discharge current to satisfy the standard waveform requirement. These findings could provide considerable insights for designing a FICBE test bench that satisfies waveform qualification requirements.INDEX TERMS Field-induced, charged board model, charged board event, circuit simulation.