1995
DOI: 10.1007/978-0-387-34867-4_25
|View full text |Cite
|
Sign up to set email alerts
|

Computer Supported Test Generation from SDL Specifications

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1

Citation Types

0
1
0

Year Published

1995
1995
1995
1995

Publication Types

Select...
1

Relationship

0
1

Authors

Journals

citations
Cited by 1 publication
(1 citation statement)
references
References 0 publications
0
1
0
Order By: Relevance
“…Annex B deals with test generation methods as they have been developed for finite state machine and other models, in particular [1], [11], [2], [13], and [6]. A common example, the INRES protocol and service [5] is used to show the applicability of existing test generation methods to an OSI protocol specification.…”
Section: Introductionmentioning
confidence: 99%
“…Annex B deals with test generation methods as they have been developed for finite state machine and other models, in particular [1], [11], [2], [13], and [6]. A common example, the INRES protocol and service [5] is used to show the applicability of existing test generation methods to an OSI protocol specification.…”
Section: Introductionmentioning
confidence: 99%