2016
DOI: 10.1088/1361-648x/29/4/045402
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Concentration dependence of hydrogen diffusion in clamped vanadium (0 0 1) films

Abstract: The chemical diffusion coefficient of hydrogen in a 50 nm thin film of vanadium (0 0 1) is measured as a function of concentration and temperature, well above the known phase boundaries. Arrhenius analysis of the tracer diffusion constants reveal large changes in the activation energy with concentration: from 0.10 at 0.05 in H V to 0.5 eV at 0.2 in H V. The results are consistent with a change from tetrahedral to octahedral site occupancy, in that concentration range. The change in site occupancy is argued to … Show more

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Cited by 3 publications
(5 citation statements)
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“…As seen in figure 2, a clear minimum in the chemical diffusion coefficients is obtained. The observed trend is consistent with that in both bulk and thin films of vanadium [12,25]. At low concentrations, the diffusion coefficients for the n Fe V 2, 3, 4 n n 7 = ( )superlattices approach the same value, which is consistent with the absence of finite size effects of the chemical diffusion in the low concentration limit [23].…”
Section: Concentration Dependence Of Hydrogen Diffusionsupporting
confidence: 86%
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“…As seen in figure 2, a clear minimum in the chemical diffusion coefficients is obtained. The observed trend is consistent with that in both bulk and thin films of vanadium [12,25]. At low concentrations, the diffusion coefficients for the n Fe V 2, 3, 4 n n 7 = ( )superlattices approach the same value, which is consistent with the absence of finite size effects of the chemical diffusion in the low concentration limit [23].…”
Section: Concentration Dependence Of Hydrogen Diffusionsupporting
confidence: 86%
“…The diffusion constants were extracted from the concentration profiles, as described in [12]. Briefly, Fick's second law…”
Section: Determination Of Diffusion Constantsmentioning
confidence: 99%
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