Concentric circular trajectory sampling for super-resolution and image mosaicing

Abstract

Ubiquitous applications in diverse fields motivate large-area sampling, super-resolution (SR) and image mosaicing. However, conventional translational sampling has drawbacks including laterally constrained variations between samples. Meanwhile, existing rotational sampling methods do not consider the uniformity of sampling points in Cartesian coordinates, resulting in additional distortion errors in sampled images. We design a novel optimized concentric circular trajectory sampling (OCCTS) method to acquire image information uniformly at fast sampling speeds. The sampling method allows multiple low-resolution images for conventional SR algorithms to be acquired by adding small variations in the angular dimension. Experimental results demonstrate that OCCTS can beat comparable CCTS methods that lack optimized sampling densities by reducing sampling time by more than 11.5% while maintaining 50% distortion error reduction. The SR quality of OCCTS has at least 5.2% fewer distortion errors than the comparable CCTS methods. This paper is the first, to the best of our knowledge, to present an OCCTS method for SR and image mosaicing.

Rotational scanning atomic force microscopy

“…Here, we report a scanning technique for AFM imaging based on the combination of circular and linear motion of the probe relative to the surface, resulting in either concentric circle or spiral scanning trajectories. A similar approach was recently reported for optical microscopy [22,23]. The use of the rotational motion as a fast scan axis allows for the avoidance of mechanical instabilities arising when the direction of motion changes rapidly.…”

“…The analysis of rotational scan for super-resolution optical microscopy [22,23] is also generally applicable to AFM, therefore we will discuss here only the concepts most relevant to the practical AFM implementation. In rotational scanning, the scan trajectory consists of a number of circles or spirals of increasing radius induced by linear translation of the probe relative to the centre of rotation.…”

Improvement of Alternative Non-Raster Scanning Methods for High Speed Atomic Force Microscopy: A Review

“…Raster scanning method is the first scanning technique developed to scan the surface of the sample that is largely used method for AFM. Although, in many applications such as, image formatting, pattern recognition, computer graphics, scanner, data compression etc., non-raster scanning can be used [49], [58], [59], [62], [64], but raster scanning is largely used method in these applications due to the ease construction of the raster pattern, ease to control, and implementation. As an earlier scanning method, a lot of work has been done on raster scanning which makes it a largely used scanning method.…”