Electrical Contacts - 1998. Proceedings of the Forty-Fourth IEEE Holm Conference on Electrical Contacts (Cat. No.98CB36238)
DOI: 10.1109/holm.1998.722428
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Concerning reliability modeling of connectors

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Cited by 17 publications
(4 citation statements)
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“…This response is determined in part by factors such as surface topography, stress distribution, uniformity of inhibitor distribution in the electrical interfaces etc. [9]- [12]. The inhibitor used in this investigation differed from one connector type to another.…”
Section: A Connector Behaviormentioning
confidence: 99%
“…This response is determined in part by factors such as surface topography, stress distribution, uniformity of inhibitor distribution in the electrical interfaces etc. [9]- [12]. The inhibitor used in this investigation differed from one connector type to another.…”
Section: A Connector Behaviormentioning
confidence: 99%
“…During the whole design process, the analysis of reliability is very important and necessary. Early, Mroczkowski has been aware that [9] and stated that designers should relate the performance parameters of connector to degradation mechanisms to assist the design and evaluation of reliability. According to the detailed discussion on the usage of a comprehensive degradation model, Mroczkowski exhibited the advantages and potential of the physics of failure (POF) method compared with the traditional statistics-based method for fast and accurate reliability design and evaluation.…”
Section: Introductionmentioning
confidence: 99%
“…Under such working or reserving conditions, contact failure is the most prevalent failure mechanism of electrical connectors. There are three types of failure (degradation) mechanisms: 1) corrosion; 2) wear; and 3) stress relaxation (loss of normal force) [3], [4]. Corrosion and wear are related with contact finish and its physics; and stress relaxation is related with contact materials selection and design.…”
Section: Introductionmentioning
confidence: 99%
“…While with longer connector lifetime, the degradation model applied widely replaced of lifetime model. Based on a study on modeling of connector degradation mechanisms, an alternative approach has been proposed in [3] and [4] to link connector degradation with reliability by an extreme-value assessment performed with failure test data. This approach is included in the British Standard BS-IEC-61586 1997 Assessment of the reliability of electrical connectors [11].…”
Section: Introductionmentioning
confidence: 99%