Extended Abstracts of the 2018 International Conference on Solid State Devices and Materials 2018
DOI: 10.7567/ssdm.2018.ps-10-09
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Conduction and valence band offsets of ZnO/β-Ga<sub>2</sub>O<sub>3 </sub>interface measured by X-ray photoelectron spectroscopy

Shun Ming Sun1,
W.J. Liu2,
Y.P. Wang3
et al.
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