2022
DOI: 10.1038/s41598-022-21882-1
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Conductive cross-section preparation of non-conductive painting micro-samples for SEM analysis

Abstract: Scanning electron microscopy (SEM) is a common method for the analysis of painting micro-samples. The high resolution of this technique offers precise surface analysis and can be coupled with an energy-dispersive spectrometer for the acquisition of the elemental composition. For light microscopy and SEM analysis, the painting micro-samples are commonly prepared as cross-sections, where the micro-sample positioned on the side is embedded in a resin. Therefore, the sequence of its layers is exposed after the cro… Show more

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Cited by 6 publications
(7 citation statements)
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“…Cannot reveal internal structures or details within particles unless the sample is specially prepared by cutting or fracturing [ 208 ].…”
Section: Figurementioning
confidence: 99%
See 1 more Smart Citation
“…Cannot reveal internal structures or details within particles unless the sample is specially prepared by cutting or fracturing [ 208 ].…”
Section: Figurementioning
confidence: 99%
“…Non-conductive samples may require special preparation techniques, such as coating with a conductive layer, to avoid charging effects [ 208 ].…”
Section: Figurementioning
confidence: 99%
“…Jaques et al [ 52 ] stated that scanning electron microscopy (SEM) represents a prevalent technique employed for the analysis of micro-samples derived from paintings. Notably, this method's heightened resolution allows for meticulous surface Figure 14.…”
Section: Paints and Fibermentioning
confidence: 99%
“…In order to maintain a stable mode of operation that can give high-quality images and measurement data, regular calibration is necessary using calibration reference materials (CRMs). 4,5…”
Section: Introductionmentioning
confidence: 99%