1969
DOI: 10.1016/0038-1098(69)90407-4
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Conductivity studies on silver oxide

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Cited by 16 publications
(11 citation statements)
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“…Instead, as light deactivation was observed, which could be attributed to the detachment of the catalyst film or the increase of the resistance by the oxidation of metallic silver. [49] This comparison measurement illustrates that Fe impurities present in the electrolyte are essential for the activation profile of the Ag-Co oxides.O n the other hand, the sample with aC o/Ag (8:1) ratio still showed the highest activity compared with other Ag-Co oxides.Asimilar activity trend was observed from the electrochemical measurements in both Fe-containing and Fe-free KOHe lectrolytes,w ith Co 8 Ag oxide being the most active OER catalyst. Clearly,the addition of Ag is beneficial to the OER activity of spinel Co 3 O 4 ,a ss hown in previous studies where Ag was employed as aconductive additive.…”
Section: Methodsmentioning
confidence: 83%
“…Instead, as light deactivation was observed, which could be attributed to the detachment of the catalyst film or the increase of the resistance by the oxidation of metallic silver. [49] This comparison measurement illustrates that Fe impurities present in the electrolyte are essential for the activation profile of the Ag-Co oxides.O n the other hand, the sample with aC o/Ag (8:1) ratio still showed the highest activity compared with other Ag-Co oxides.Asimilar activity trend was observed from the electrochemical measurements in both Fe-containing and Fe-free KOHe lectrolytes,w ith Co 8 Ag oxide being the most active OER catalyst. Clearly,the addition of Ag is beneficial to the OER activity of spinel Co 3 O 4 ,a ss hown in previous studies where Ag was employed as aconductive additive.…”
Section: Methodsmentioning
confidence: 83%
“…This fact is a result of the sealing of the pore bottoms and walls by Ag2O, which strongly hinders the access of MCM ions to the metallic surface (across the dense AAO sublayer). However, due to the semiconductor properties of Ag2O established by Talukdar et al [80] the formed layer of silver oxide deposits also does not completely hinder the charge diffusion between the sealed pore bottoms and the metallic surface of the substrate. That is why, the exponential multiplier (n) of the CPEdiff element for Al-O-Ag systems does not reach unit, although it is close to this value.…”
Section: Eis Resultsmentioning
confidence: 97%
“…1 , the electrical resistance−strain curve of I = 0.3 A started to deviate from that collected without an electrical current at ε = ~10%. According to previous studies, oxidation 36 , 37 or electromigration 16 , 17 in the Ag film could be responsible for the loss of electrical conductivity (i.e., the increase of resistance). However, the SEM micrographs and scanning X-ray photoelectron spectroscopy analysis of the tested sample surface, shown in Figs 4 and S3 , revealed no evidence of oxides or electromigration, the latter of which would be indicated by the accumulation of material (hillocks) at the anode and depletion (voids) at the cathode 38 , 39 .…”
Section: Resultsmentioning
confidence: 94%