Conductors, semiconductors, and insulators irradiated with short-wavelength free-electron laser

Krzywiński, J.; Sobierajski, R.; Jurek, M.; Nietubyć, R.; Pełka, J.; Juha, L.; Bittner, Michal; Letal, Vit; Vorlı́ček, V.; Andrejczuk, A.; Feldhaus, J.; Keitel, Barbara; Saldin, E.L.; Schneidmiller, E. A.; Treusch, R.; Yurkov, M.V.

doi:10.1063/1.2434989

Cited by 44 publications

(26 citation statements)

References 22 publications

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“…The threshold for ZnO was found to be 167.8 ± 30.8 mJ/cm 2 . The value for Ce:YAG is much higher than the previously reported damage threshold result of about 20 mJ/cm 2 [24]. However, our value was obtained for irradiation with 4.6 nm wavelength FEL beam while previous results were obtained for the extreme ultraviolet (89 nm) FEL radiation.…”

Section: Resultscontrasting

confidence: 55%

Soft x-ray free-electron laser induced damage to inorganic scintillators

Burian¹,

Hájková²,

Chalupský³

et al. 2015

Opt. Mater. Express

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An irreversible response of inorganic scintillators to intense soft xray laser radiation was investigated at the FLASH (Free-electron LASer in Hamburg) facility. Three ionic crystals, namely, Ce:YAG (cerium-doped yttrium aluminum garnet), PbWO 4 (lead tungstate), and ZnO (zinc oxide), were exposed to single 4.6 nm ultra-short laser pulses of variable pulse energy (up to 12 μJ) under normal incidence conditions with tight focus. Damaged areas produced with various levels of pulse fluences, were analyzed on the surface of irradiated samples using differential interference contrast (DIC) and atomic force microscopy (AFM). The effective beam area of 22.2 ± 2.2 μm 2 was determined by means of the ablation imprints method with the use of poly(methyl methacrylate) -PMMA. Applied to the three inorganic materials, this procedure gave almost the same values of an effective area. The single-shot damage threshold fluence was determined for each of these inorganic materials. The Ce:YAG sample seems to be the most radiation resistant under the given irradiation conditions, its damage threshold was determined to be as high as 660.8 ± 71.2 mJ/cm 2 . Contrary to that, the PbWO 4 sample exhibited the lowest radiation resistance with a threshold fluence of 62.6 ± 11.9 mJ/cm 2 . The threshold for ZnO was found to be 167.8 ± 30.8 mJ/cm 2 . Both interaction and material characteristics responsible for the damage threshold difference are discussed in the article.

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Section: Resultscontrasting

confidence: 55%

Soft x-ray free-electron laser induced damage to inorganic scintillators

Burian¹,

Hájková²,

Chalupský³

et al. 2015

Opt. Mater. Express

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“…Our previous XUV/x-ray interaction studies were mainly focused on basic characteristics of single-shot ablation processes, namely the determination of the attenuation length and the ablation threshold [12][13][14][15][16][17][18][19]22]. All of the results were for various solid state materials determined using a method reported by Liu [21] based on the morphology of the ablated crater.…”

Section: Single-shot Damage Experimentsmentioning

confidence: 99%

“…An extension of ablation studies into soft xray/XUV region has been enabled by the above-mentioned development of new sources. A few papers have been published dealing with topics of soft x-ray/XUV laser damage to various solid materials [12][13][14][15][16][17][18][19]22], primarily motivated by testing materials for short wavelength optical elements. All of the reflecting optical components used in soft x-ray beamlines have to be resistant to damage by energetic photons (30eV -200eV), but also have to provide the highest possible reflectivity for a long period of time.…”

Section: Introductionmentioning

confidence: 99%

Non-thermal desorption/ablation of molecular solids induced by ultra-short soft x-ray pulses

Chalupský¹,

Juha²,

Hájková³

et al. 2008

Opt. Express

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Abstract:We report the first observation of single-shot soft x-ray laser induced desorption occurring below the ablation threshold in a thin layer of poly (methyl methacrylate) -PMMA. Irradiated by the focused beam from the Free-electron LASer in Hamburg (FLASH) at 21.7nm, the samples have been investigated by atomic-force microscope (AFM) enabling the visualization of mild surface modifications caused by the desorption. A model describing non-thermal desorption and ablation has been developed and used to analyze single-shot imprints in PMMA. An intermediate regime of materials removal has been found, confirming model predictions. We also report below-threshold multiple-shot desorption of PMMA induced by high-order harmonics (HOH) at 32nm. Short-time exposure imprints provide sufficient information about transverse beam profile in HOH's tight focus whereas long-time exposed PMMA exhibits radiation-initiated surface hardening making the beam profile measurement infeasible. B. Rus, A. Carillon, P. Dhez, P. Jaeglé, G. Jamelot, A. Klisnick, M. Nantel, and P. Zeitoun, "An efficient, high-brightness soft X-ray laser at 21.2 nm," Phys. Rev. A55, 3858-3873 (1997 S. Heinbuch, M. Grisham, D. Martz, and J. J. Rocca, "Demonstration of a desk-top size high repetition rate soft x-ray laser," Opt. Express 13, 4050-4055 (2005). 10. P. E. Dyer, "Excimer laser polymer ablation: twenty years on," Appl. Phys. A77, 167-173 (2003), and references cited therein. 11. L. V. Zhigilei, B. J. Garrison, "Molecular dynamics simulation study of the fluence dependence of particle yield and plume composition in laser desorption and ablation of organic solids," Appl. Phys. Lett. 74, 1341-1343 (1999)

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“…In striking contrast, the application of the mixed XUV/Vis-NIR field resulted in clearly visible, irreversible surface modification after irradiation with only a few shots. The damage is characteristic due to material expansion, quite different from ablation craters observed in experiments with pure XUV pulses (Chalupsky et al, 2007;Juha et al, 2005;Vaschenko et al, 2006;Krzywinski et al, 2007;Mocek et al, 2006). A very interesting feature in Fig.…”

Section: Materials Surface Processingmentioning

confidence: 64%

High-order Harmonic Generation

Jakubczak¹

2010

Laser Pulse Phenomena and Applications

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Conductors, semiconductors, and insulators irradiated with short-wavelength free-electron laser

Cited by 44 publications

References 22 publications

Soft x-ray free-electron laser induced damage to inorganic scintillators

Soft x-ray free-electron laser induced damage to inorganic scintillators

Non-thermal desorption/ablation of molecular solids induced by ultra-short soft x-ray pulses

High-order Harmonic Generation

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