Confocal laser scanning microscopy of active color centers based strips induced on LiF by low energy electron beams

Almaviva, S.; Baldacchini, G.; Piccinini, M.; Montereali, Rosa Maria

doi:10.1016/j.jnoncrysol.2006.11.018

Cited by 3 publications

(5 citation statements)

References 12 publications

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“…It is peaked at around half of the maximum electron penetration depth, which is equal to about 1.5 µm at the selected energy. The CC concentrations along the depth are assumed as proportional to the energy released by electrons, in agreement with the experimental results obtained for F 2 and F 3 + active defects by using a confocal microscope operating in fluorescence mode [22,5]. As sketched in Fig.3, a staircase model, consisting of six layers with equal thickness, 250 nm -whose height is chosen to have a rectangle area equal to the one under the curve -is adopted to properly take into account the graded index profile.…”

Section: Resultssupporting

confidence: 74%

“…6. This band was already found in the absorption spectra of LiF crystals [5,13] and films colored by other kind of ionizing radiation and it was ascribed to the presence of lithium nano-aggregates. However, perturbed F-aggregate defects have been also proposed in the literature to account for that feature.…”

mentioning

confidence: 60%

“…On the basis of this semi-classical dipole-electromagnetic field interaction model, later generalized to include the contribution of inhomogeneous Gaussian absorption bands [19], the complex permittivity of the irradiated surface layer can be modeled as the sum of distinct absorption-band contributions, each one due to different types of CCs; the complex permittivity is dependent on the photon energy, on the amplitudes of the dielectric susceptibilities at the resonance absorption energies of CCs for Lorentzian and Gaussian bands, and on their half widths at half maximum (HWHMs). The dielectric susceptibilities are also dependent on the penetration depth of low-energy electrons, due to the proportionality of these quantities to the concentration of CCs along the depth [5], i.e. the dipole densities of harmonic oscillators.…”

Section: Thin-film Modeling Of the Colored Layer And Best Fit Proceduresmentioning

confidence: 99%

“…As a matter of fact, this kind of radiation gives rise to the efficient formation of optically active defects and simultaneously induces a local modification in the refractive index of the irradiated layer. The depth profile of the irradiated layer is strongly influenced by the selected irradiation method and conditions [5,6]. Generally, guided light propagation is allowed in the same spectral range where the red and green broad photoemission bands of F 2 and F 3 + centers (two electrons bound to two and three anion vacancies, respectively) are located [7].…”

Section: Introductionmentioning

confidence: 99%

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Advanced optical characterization of broad-band light-emitting color-center strip waveguides in lithium fluoride

et al. 2008

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Broad-band light-emitting color-center active waveguides induced at the surface of Lithium Fluoride, LiF, crystals by direct writing with low-energy electron beams show great potentialities for the realization of innovative miniaturized solid-state light sources, optical amplifiers and lasers operating in the green-red wavelength interval under optical pumping in the blue spectral range. Their full spectral characterization, hence the optimization of LiF-based single-mode active waveguides, still remains a difficult task. Color-center micro-strip waveguides induced by electron-beam lithography in LiF crystals were successfully characterized via fluorescence imaging microscopy and optical transmittance measurements performed in a versatile spectrophotometer that can measure the transmittance through microstructures down to dimensions of about 50 µm. The irradiation gave rise to the stable formation of primary and aggregate color centers within a thin surface layer of the crystal, whose refractive index is locally modified with respect to the surrounding blank material. The electronic defect volume concentrations and the wavelength-dependent refractive index modifications were evaluated as functions of the irradiation dose for three active micro-strips produced by 12 keV electrons on the same LiF crystal.

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Section: Resultssupporting

confidence: 74%

mentioning

confidence: 60%

Section: Thin-film Modeling Of the Colored Layer And Best Fit Proceduresmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

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Advanced optical characterization of broad-band light-emitting color-center strip waveguides in lithium fluoride

et al. 2008

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“…In comparison, the lifetime of stored CCs in IPs is of a few hours and the corresponding readout process must be carried out immediately after the exposure. Note that these centers can also be generated by protons (Piccinini et al, 2017;Montereali et al, 2018), neutrons (Faenov et al, 2015), electrons (Almaviva et al, 2007), and and X-ray photons (Kurobori et al, 2014;Voitovich et al, 2013).…”

Section: Introductionmentioning

confidence: 99%

Soft X-ray diffraction patterns measured by a LiF detector with sub-micrometre resolution and an ultimate dynamic range

et al. 2020

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The unique diagnostic possibilities of X-ray diffraction, small X-ray scattering and phase-contrast imaging techniques applied with high-intensity coherent X-ray synchrotron and X-ray free-electron laser radiation can only be fully realized if a sufficient dynamic range and/or spatial resolution of the detector is available. In this work, it is demonstrated that the use of lithium fluoride (LiF) as a photoluminescence (PL) imaging detector allows measuring of an X-ray diffraction image with a dynamic range of ∼107 within the sub-micrometre spatial resolution. At the PETRA III facility, the diffraction pattern created behind a circular aperture with a diameter of 5 µm irradiated by a beam with a photon energy of 500 eV was recorded on a LiF crystal. In the diffraction pattern, the accumulated dose was varied from 1.7 × 105 J cm−3 in the central maximum to 2 × 10−2 J cm−3 in the 16th maximum of diffraction fringes. The period of the last fringe was measured with 0.8 µm width. The PL response of the LiF crystal being used as a detector on the irradiation dose of 500 eV photons was evaluated. For the particular model of laser-scanning confocal microscope Carl Zeiss LSM700, used for the readout of the PL signal, the calibration dependencies on the intensity of photopumping (excitation) radiation (λ = 488 nm) and the gain have been obtained.

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Fluorescence Properties of Colour Centres Produced by Ultrashort Laser Irradiation in LiF Crystals

Samad¹,

Courrol²,

Gomes³

et al. 2010

J. Phys.: Conf. Ser.

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Confocal laser scanning microscopy of active color centers based strips induced on LiF by low energy electron beams

Cited by 3 publications

References 12 publications

Advanced optical characterization of broad-band light-emitting color-center strip waveguides in lithium fluoride

Advanced optical characterization of broad-band light-emitting color-center strip waveguides in lithium fluoride

Soft X-ray diffraction patterns measured by a LiF detector with sub-micrometre resolution and an ultimate dynamic range

Fluorescence Properties of Colour Centres Produced by Ultrashort Laser Irradiation in LiF Crystals

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