Conservative and dissipative tip-sample interaction forces probed with dynamic AFM

Abstract

The conservative and dissipative forces between tip and sample of a dynamic atomic force microscopy ͑AFM͒ were investigated using a combination of computer simulations and experimental AFM data obtained by the frequency modulation technique. In this way it became possible to reconstruct complete force versus distance curves and damping coefficient versus distance curves from experimental data without using fit parameters for the interaction force and without using analytical interaction models. A comparison with analytical approaches is given and a way to determine a damping coefficient curve from experimental data is proposed. The results include the determination of the first point of repulsive contact of a vibrating tip when approaching a sample. The capability of quantifying the tip-sample interaction is demonstrated using experimental data obtained with a silicon tip and a mica sample in UHV. ͓S0163-1829͑99͒01839-1͔

Force measurements with the atomic force microscope: Technique, interpretation and applications

“…This phase shift is measured versus distance. One problem is that the theoretical analysis is not straightforward and the method is not really used for quantitative measurements of surface forces but it is mainly used for imaging in non-contact mode [59][60][61][62][63][64][65][66][67][68].…”

Influence of noncontact dissipation in the tapping mode: Attempt to extract quantitative information on the surface properties with the local force probe method

“…4,[22][23][24][25][26] Since the tip does not touch the sample, a question rises on the physical origin of the increase of the loss of energy. A few recent works have been specially dedicated to the study of the microlever energy loss in NC-AFM.…”

“…A few recent works have been specially dedicated to the study of the microlever energy loss in NC-AFM. [22][23][24][25][26] In Ref. 26, the local deformation of the sample under the action of the oscillating tip is considered as being the leading term to explain the physical origin of the additional dissipation.…”

Multi-modal analysis on the intermittent contact dynamics of atomic force microscope

“…THD with the maximum value of 15 percent is observed when an AFM is driven at the first natural frequency [16]. The higher modes participation in the motion has been fully recognized in the vibration of scanning acoustic microscope, which is also a cantilever structure and has stronger tip-sample interaction [17]. Attard et al [13] noticed that the tip mass can significantly contribute to the whole system inertia.…”