2012
DOI: 10.1143/jjap.51.096101
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Consideration of Secondary Electron Emission Effect for Probe Measurement

Abstract: The valence band structure of the (100) face of substoichiometric VN and VC has been studied using angle-resolved photoelectron spectroscopy. The experimental results are compared with theoretical spectra, calculated for the stoichiometric composition. The overall agreement between experiment and theory is found to be fairly good concerning both the trends in the peak dispersions and the relative peak intensities, although discrepancies in absolute peak positions occur. The similarities and differences in the … Show more

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Cited by 2 publications
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“…However, for a Maxwellian distribution of the electrons, it does not depend on sheath potential, but is usually a function of the electron temperature. [2,7,28] By using the Sternglass formula e ( ) = m m exp(2 − 2 √ ∕ m ), [29] where m is the maximum of e , and m is the characteristic energy corresponding to m , eff can be expressed as, [28]…”
Section: Sheath Modelmentioning
confidence: 99%
“…However, for a Maxwellian distribution of the electrons, it does not depend on sheath potential, but is usually a function of the electron temperature. [2,7,28] By using the Sternglass formula e ( ) = m m exp(2 − 2 √ ∕ m ), [29] where m is the maximum of e , and m is the characteristic energy corresponding to m , eff can be expressed as, [28]…”
Section: Sheath Modelmentioning
confidence: 99%
“…In general, the problem should be solved with the kinetic approach, but this aspect is not yet addressed in the present paper. Experimental findings in the laboratory indicate that the actual values of δ eff do not depend on φ 0 , but are usually a function of the electron temperature T [27,28] .…”
Section: Model For Secondary Electron Emissionmentioning
confidence: 99%