2019
DOI: 10.1021/acsami.9b04991
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Consistent Device Simulation Model Describing Perovskite Solar Cells in Steady-State, Transient, and Frequency Domain

Abstract: In this section the governing equations of the drift-diffusion model implemented in Setfos 4.6 1 are explained. The quantities are described in the next section.

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Cited by 98 publications
(99 citation statements)
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“…[24,25,40], while the Suns-V OC method is also used in Refs. [2,4,12,16,34]. We consider both the dark J -V and Suns-V OC methods in this work.…”
Section: -3mentioning
confidence: 99%
See 1 more Smart Citation
“…[24,25,40], while the Suns-V OC method is also used in Refs. [2,4,12,16,34]. We consider both the dark J -V and Suns-V OC methods in this work.…”
Section: -3mentioning
confidence: 99%
“…Drift-diffusion models incorporating mobile ionic charge have been shown to be capable of reproducing a wide variety of experimentally observed behavior [32][33][34][35]. In PSCs, a high density of mobile ionic charge is predicted to exist within the perovskite material [36].…”
Section: Introductionmentioning
confidence: 99%
“…While the spatial distribution may slightly alter the shape of the J-V curves, it does not determine the presence of hysteresis. 71 We note that interfacial recombination would have a significant effect on device hysteresis in cases where it serves as an additional loss mechanism or is associated with a high trap density. 23 As has been reported for some memory devices, 72 the filling of the traps may form a space charge that would diminish the free charge density in their vicinity, and thus limit or delay the current flow.…”
Section: Role Of Bulk and Interface Recombinationmentioning
confidence: 89%
“…So far, several device models have been reported for describing the operation of PSCs. [ 9,14,20–26 ] Reenen et al explained the hysteretic I – V of PSCs by combining ion motion and charge trapping at the interfaces of perovskite layer. [ 14 ] However, their choice of ion density (10 24 m −3 ) and relative dielectric constant (6.5) is not consistent with other reports.…”
Section: Introductionmentioning
confidence: 99%
“…[ 25 ] Recently, Neukom et al applied an electronic‐ionic device model to simulate a series of experiments, but a validation of the multiple fit parameters was missing. [ 22 ]…”
Section: Introductionmentioning
confidence: 99%