Constant‐Distance Mode Scanning Electrochemical Microscopy. Part II: High‐Resolution SECM Imaging Employing Pt Nanoelectrodes as Miniaturized Scanning Probes

Katemann, Bernardo Ballesteros; Schulte, Albert; Schuhmann, Wolfgang

doi:10.1002/elan.200302918

Cited by 94 publications

(64 citation statements)

References 37 publications

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“…Very clear benefit in the imaging of this structure using a 225 nm radius probe electrode rather than the more traditional 5 mm radius probe was presented. 18 …”

Section: Physical Electrochemistrymentioning

confidence: 99%

Nanoelectrodes, nanoelectrode arrays and their applications

Arrigan

2004

Analyst

464

432

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This review deals with the topic of ultrasmall electrodes, namely nanoelectrodes, arrays of these and discusses possible applications, including to analytical science. It deals exclusively with the use of nanoelectrodes in an electrochemical context. Benefits that accrue from use of very small working electrodes within electrochemical cells are discussed, followed by a review of methods for the preparation of such electrodes. Individual nanoelectrodes and arrays or ensembles of these are addressed, as are nanopore systems which seek to emulate biological transmembrane ion transport processes. Applications within physical electrochemistry, imaging science and analytical science are summarised.

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“…Very clear benefit in the imaging of this structure using a 225 nm radius probe electrode rather than the more traditional 5 mm radius probe was presented. 18 …”

Section: Physical Electrochemistrymentioning

confidence: 99%

Nanoelectrodes, nanoelectrode arrays and their applications

Arrigan

2004

Analyst

464

432

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“…Simões et al [120] studied the corrosion behavior of an iron/zinc galvanic couple immersed in aqueous sodium chloride solution. The SECM studies were also occasionally enhanced by impedance measurements [111,115,[121][122][123], although the reasons for the contrast observed are not always clear and seem to be affected by several factors [122].…”

Section: Metalsmentioning

confidence: 99%

“…Several comprehensive reviews [44,[47][48][49][50][51][52][53][54][55][56][57][58], books [45,59], and book chapters [60][61][62][63][64][65][66][67] are available about this technique; the reader is referred to these for detailed information about instrumental set-up, concept, measurement modes, and data interpretation. Besides approaches combining SECM with other scanning probe techniques, for example EC-STM [68][69][70][71] and AFM [72][73][74][75][76][77], the work of Schuhmann et al [78,79] popularized the use of a shear-force-based distance-control mechanism in the SECM community.…”

Section: Introductionmentioning

confidence: 99%

Multidimensional electrochemical imaging in materials science

2007

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In the past 20 years the characterization of electroactive surfaces and electrode reactions by scanning probe techniques has advanced significantly, benefiting from instrumental and methodological developments in the field. Electrochemical and electrical analysis instruments are attractive tools for identifying regions of different electrochemical properties and chemical reactivity and contribute to the advancement of molecular electronics. Besides their function as a surface analytical device, they have proved to be unique tools for local synthesis of polymers, metal depots, clusters, etc. This review will focus primarily on progress made by use of scanning electrochemical microscopy (SECM), conductive AFM (C-AFM), electrochemical scanning tunneling microscopy (EC-STM), and surface potential measurements, for example Kelvin probe force microscopy (KFM), for multidimensional imaging of potential-dependent processes on metals and electrified surfaces modified with polymers and self assembled monolayers.

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“…To maintain a constant distance between tip and sample surface a non-optical shear force method was used according to Schuhmann and co-workers [23][24][25]33]. At the constant distance mode measurements the tip approach was stopped at a change of 50 mV SF-amplitude signal (∆SF-amplitude).…”

Section: Scanning Electrochemical Microscopymentioning

confidence: 99%

Scanning Electrochemical Microscopy as a Characterization Tool for Reduced Graphene Oxide Field Effect Transistors

Reiner‐Rozman

Schodl

Nowak

et al. 2015

e-J. Surf. Sci. Nanotech.

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Reduced graphene oxide coated SiO2/Si substrates were obtained by wet-chemical reduction of graphene oxide for the use as semiconductor material in field-effect transistors. The morphological and chemical characterization was done by using SEM, Raman spectroscopy and XPS. Raman and XPS measurements can characterize the success of the graphene-oxide reduction, but only for small parts spots of the surface (e.g. 0.41 µm 2 laser spot size with Raman). In order to evaluate larger surface areas and the electrochemical activity of the graphene oxide and reduced graphene oxide, additional spectroscopic measurements using the SECM were performed. The samples coated with unreduced graphene oxide showed no electrochemical activity, while reduced graphene oxide samples showed conducting properties. Further information about the topology of the surface was obtained by applying the SECM constant distance mode. The degree of graphene coverage was calculated from SECM data and compared to the coverage obtained by SEM. It was found that 68±7% coverage is sufficient to ensure electronic contact between the Source and Drain electrodes (resistance less than 1 kΩ). Functionality of the fabricated field effect transistors was demonstrated by titration of pH solutions and characterization of the characteristic curves.

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Constant‐Distance Mode Scanning Electrochemical Microscopy. Part II: High‐Resolution SECM Imaging Employing Pt Nanoelectrodes as Miniaturized Scanning Probes

Cited by 94 publications

References 37 publications

Nanoelectrodes, nanoelectrode arrays and their applications

Nanoelectrodes, nanoelectrode arrays and their applications

Multidimensional electrochemical imaging in materials science

Scanning Electrochemical Microscopy as a Characterization Tool for Reduced Graphene Oxide Field Effect Transistors

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