Construction of a dilution refrigerator cooled scanning force microscope

Gildemeister, A. E.; Ihn, Thomas; Barengo, C.; Studerus, P.; Ensslin, Klaus

doi:10.1063/1.2431793

Cited by 32 publications

(21 citation statements)

References 20 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…The experiments were carried out during a single cooldown in a dilution refrigerator cooled SFM [12] with an electrochemically etched PtIr tip. The electronic temperature of the sample was about 190 mK as determined from the width of conductance resonances in the Coulomb blockade regime.…”

Section: Methodsmentioning

confidence: 99%

Measurement of the tip-induced potential in scanning gate experiments

et al. 2007

Self Cite

View full text Add to dashboard Cite

We present a detailed experimental study on the electrostatic interaction between a quantum dot and the metallic tip of a scanning force microscope. Our method allowed us to quantitatively map the tip-induced potential and to determine the spatial dependence of the tip's lever arm with high resolution. We find that two parts of the tip-induced potential can be distinguished, one that depends on the voltage applied to the tip and one that is independent of this voltage. The first part is due to the metallic tip while we interpret the second part as the effect of a charged dielectric particle on the tip. In the measurements of the lever arm we find fine structure that depends on which quantum state we study. The results are discussed in view of scanning gate experiments where the tip is used as a movable gate to study nanostructures.

show abstract

Section: Methodsmentioning

confidence: 99%

Measurement of the tip-induced potential in scanning gate experiments

et al. 2007

Self Cite

View full text Add to dashboard Cite

show abstract

“…At present only few scanning probe microscopes (SPM), which can be operated well below 1 K, have been reported. [1][2][3][4][5][6][7][8][9] Those adapted to dilution refrigerators seem to be most interesting, as this technology is unique in providing a cold point stable in time that can cool down large devices to temperatures which are 1 or 2 orders of magnitude below 1 K. Moreover, it can be easily combined with high magnetic field setups, and the recent advances in pulse tube technology have considerably simplified its operation. 10,11 Very low temperature SPM offers surface characterization possibilities in, e.g., quantum nanostructures in semiconductors or in superconductors.…”

Section: Introductionmentioning

confidence: 99%

Compact very low temperature scanning tunneling microscope with mechanically driven horizontal linear positioning stage

Suderow¹,

Guillamón²,

Vieira³

2011

Review of Scientific Instruments

View full text Add to dashboard Cite

We describe a scanning tunneling microscope for operation in a dilution refrigerator with a sample stage which can be moved macroscopically in a range up to a cm and with an accuracy down to the tens of nm. The position of the tip over the sample as set at room temperature does not change more than a few micrometers when cooling down. This feature is particularly interesting for work on micrometer sized samples. Nanostructures can be also localized and studied, provided they are repeated over micrometer sized areas. The same stage can be used to approach a hard single crystalline sample to a knife and cleave it, or break it, in situ. In situ positioning is demonstrated with measurements at 0.1 K in nanofabricated samples. Atomic resolution down to 0.1 K and in magnetic fields of 8 T is demonstrated in NbSe(2). No heat dissipation nor an increase in mechanical noise has been observed at 0.1 K when operating the slider.

show abstract

“…This has been recognized by recent work on tuning PLLs for an AFM experiment where the PLL reference signal is used to drive the probe oscillation. 30,31 However, in many cases the probe is driven by its own phase-shifted and amplified thermal noise, 2 and the PLL is ͑only͒ used to detect the fre-quency of this so-called self-oscillation ͑see Fig. 1͒.…”

Section: Introductionmentioning

confidence: 99%

Digitally tunable, wide-band amplitude, phase, and frequency detection for atomic-resolution scanning force microscopy

Khan

Leung

Tahir

et al. 2010

Review of Scientific Instruments

View full text Add to dashboard Cite

Frequency-modulation atomic force microscopy (FM-AFM) relies on an accurate tracking of the resonance frequency of a scanning probe. It is now used in environments ranging from ultrahigh vacuum to aqueous solutions, for slow and for fast imaging, with probes resonating from a few kilohertz up to several megahertz. Here we present a versatile experimental setup that detects amplitude, phase, and frequency of AFM probes for resonance frequencies up to 15 MHz and with >70 kHz maximum bandwidth for amplitude/phase detection. We provide generic parameter settings for variable-bandwidth frequency detection and test these using our setup. The signal-to-noise ratio of the frequency detector is sufficiently high to record atomic-resolution images of mica by FM-AFM in aqueous solution.

show abstract

Construction of a dilution refrigerator cooled scanning force microscope

Cited by 32 publications

References 20 publications

Measurement of the tip-induced potential in scanning gate experiments

Measurement of the tip-induced potential in scanning gate experiments

Compact very low temperature scanning tunneling microscope with mechanically driven horizontal linear positioning stage

Digitally tunable, wide-band amplitude, phase, and frequency detection for atomic-resolution scanning force microscopy

Contact Info

Product

Resources

About