2000
DOI: 10.1002/1096-9918(200008)30:1<488::aid-sia755>3.0.co;2-r
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Construction of an ELS-LEED: an electron energy-loss spectrometer with electrostatic two-dimensional angular scanning

Abstract: A new version of an energy-loss spectrometer with low-energy electron diffraction (ELS-LEED, Henzler type EELS) has been constructed. Different from the prototype spectrometer, which is equipped with a single-pass 127 °cylindrical deflector analyser, the present spectrometer consists of an Ibach-type double-pass monochromator, an enlarged single-pass analyser and some magnetic lenses in acceleration and deceleration lenses and in the electrostatic deflection unit for high-resolution LEED. As a preliminary resu… Show more

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Cited by 16 publications
(11 citation statements)
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“…Electron beams are transferred between these modules through acceleration and deceleration focusing lenses. The whole spectrometer consists of 39 electrodes in total and all the 39 electrode [6]. The spectrometer is installed in a permalloy ultrahigh-vacuum chamber with residual magnetic field below 1mGauss.…”
Section: Methodssupporting
confidence: 87%
“…Electron beams are transferred between these modules through acceleration and deceleration focusing lenses. The whole spectrometer consists of 39 electrodes in total and all the 39 electrode [6]. The spectrometer is installed in a permalloy ultrahigh-vacuum chamber with residual magnetic field below 1mGauss.…”
Section: Methodssupporting
confidence: 87%
“…However, if the structure of a non-commensurate (i.e., point-on-line, line-on-line, or incommensurate) [4][5][6] overlayer on a known substrate or the structure of a totally unknown sample is to be measured accurately, one has to rely on the visualization of the k-space of the specimen. Owing to the characteristics of the various experimental setups and/or the recording of the diffraction patterns, image distortions will generally occur not only in LEED 2,[7][8][9][10] but also in other diffraction methods. [11][12][13][14] Depending on the purpose of investigation, for example, when measuring lattice parameters and strain or when classifying the coincidence of an epitaxial organic layer, the distortions must be corrected in order to make these measurements meaningful.…”
Section: Introductionmentioning
confidence: 99%
“…The plasmon measurements were performed in ultrahigh vacuum (6 10 ÿ11 Torr base pressure) by use of EELS with a highly collimated slow electron beam [11]. The spectrometer can also be operated in the energy-filtered low-energy electron diffraction (LEED) mode with a typical resolution of 0:005 A ÿ1 and momentum range of jqj < 2:5 A ÿ1 .…”
mentioning
confidence: 99%