“…To further estimate the capacitive and diffusion-limited contribution to the total capacitance in Co(OH) 2 NS/LSG, the voltammetric scan rate dependence was systematically investigated using Dunn's method (eqn (7) and (8)). 53,54 i ( V ) = k 1 ν + k 2 ν 1/2 i ( V )/ ν 1/2 = k 1 ν 1/2 + k 2 Here, i ( V ) is the current at a specified potential, and k 1 ν and k 2 ν 1/2 represent the current contribution from surface capacitive and diffusion-controlled intercalation processes, respectively. The slope and intercept values from the linear fit of ν 1/2 vs. i ( V )/ ν 1/2 plot correspond to k 1 and k 2 , respectively.…”