2020
DOI: 10.1017/s1551929520001571
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Contact AFM Nanolithography Based on Anodic Oxidation

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Cited by 2 publications
(1 citation statement)
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“…Atomic Force Microscopy (AFM) has the ability to move a probe over a specific sample surface in a controlled manner, by controlling this applied normal force (Fn) between the probe and the sample surface, thus forming silicon channels (Jirlèn et al, 2017), oxides (Melgarejo et al, 2020), polymers (Stoica;Barzic;Hulubei, 2017), magnetic materials and semiconductors (Celano, 2019).…”
mentioning
confidence: 99%
“…Atomic Force Microscopy (AFM) has the ability to move a probe over a specific sample surface in a controlled manner, by controlling this applied normal force (Fn) between the probe and the sample surface, thus forming silicon channels (Jirlèn et al, 2017), oxides (Melgarejo et al, 2020), polymers (Stoica;Barzic;Hulubei, 2017), magnetic materials and semiconductors (Celano, 2019).…”
mentioning
confidence: 99%