2012
DOI: 10.1209/0295-5075/100/14003
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Contact line singularity at partial wetting during evaporation driven by substrate heating

Abstract: We present a theoretical investigation of the evaporation of a liquid on a solid substrate into the atmosphere of its pure vapor. The evaporation is provoked by the overheating of the substrate above the saturation temperature. At partial wetting, the liquid forms a wedge ending at the triple liquid-vapor-solid contact line (CL). The wedge region is extremely important in all evaporation geometries (bubble, drop, meniscus in a capillary) for two reasons. First, in this region a significant part of the evaporat… Show more

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Cited by 33 publications
(48 citation statements)
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“…where the right hand side is finite. The integral in the left hand side can only be convergent if Q(r) → 0 when r → ∞ which proves equation (24). It means that the overall mass flux transferred to the gas environment is zero, which is consistent with the assumption of thermodynamic equilibrium at r → ∞.…”
Section: Mass Conservation Issuesupporting
confidence: 68%
See 2 more Smart Citations
“…where the right hand side is finite. The integral in the left hand side can only be convergent if Q(r) → 0 when r → ∞ which proves equation (24). It means that the overall mass flux transferred to the gas environment is zero, which is consistent with the assumption of thermodynamic equilibrium at r → ∞.…”
Section: Mass Conservation Issuesupporting
confidence: 68%
“…We propose a rigorous solution for the case of diffusioncontrolled evaporation, when an inert gas is present in the atmosphere. Our work follows recent studies dedicated to the case of a liquid surrounded by its pure vapor [24][25][26], where the phase change is controlled by the latent heat effect.…”
Section: Resultsmentioning
confidence: 91%
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“…Here we consider the contact line motion of a volatile liquid in contact with an atmosphere of its pure vapor, see [20][21][22][23][24] and references therein. We show that the lubrication equation is perfectly regular when evaporation/condensation processes are taken into account.…”
mentioning
confidence: 99%
“…While the overall evaporation is weak, the evaporation mass flux varies sharply over the film area. The evaporation rate is especially strong near the contact line [11,12], which creates high apparent contact angles [13] in spite of the complete wetting conditions at equilibrium. The high contact angle, in its turn, causes the capillary dewetting phenomenon and a ridge-like structure along the contact line (cf.…”
Section: D Reconstructionmentioning
confidence: 99%