Contact voltage analysis for degraded contact surfaces by power arcing phenomenon

Choi, E. Yee Kin; Carvou, Erwann; Bourda, C.; Vassa, A.; Benjemaa, N.; Mitchell, Jack

doi:10.1109/holm.2014.7031023

2014 IEEE 60th Holm Conference on Electrical Contacts (Holm) 2014

DOI: 10.1109/holm.2014.7031023

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Contact voltage analysis for degraded contact surfaces by power arcing phenomenon

E. Yee Kin Choi¹,

Erwann Carvou

C. Bourda³

et al.

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Contact voltage analysis for degraded contact surfaces by power arcing phenomenon

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References 8 publications

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