2021
DOI: 10.1002/solr.202170083
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Contactless and Spatially Resolved Determination of Current−Voltage Curves in Perovskite Solar Cells via Photoluminescence

Abstract: Imaging In article number http://doi.wiley.com/10.1002/solr.202100348, Anh Dinh Bui, Daniel Macdonald, Hieu T. Nguyen, and co‐workers report a fast, non‐invasive, camera‐based method to image pseudo current density ‐ voltage curves of various perovskite‐based structures from partially finished to finished cells with micron‐scale spatial resolution. This approach is useful to resolve the inhomogeneity of implied open‐circuit voltage and maximum fill factor across the devices, and their evolution during degrada… Show more

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Cited by 7 publications
(11 citation statements)
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“…In this section, we briefly describe the procedure to extract the implied open‐circuit voltage iV oc , ideality factor n id and activation energy E A of perovskite materials from their PL intensity. First, the method to extract iV oc from PL spectra has been described in our previous work 17 . Briefly, using the generalized Planck law, 19,22 the detected intensity at each pixel in the PL image emitted from the sample is given by 17 Ixy_detected=italicSF×B()Eexp()iVocVT, where SF is a scaling factor, which accounts for the fraction of light emission detected by the measurement system, and E is the photon energy.…”
Section: Methods Descriptionsmentioning
confidence: 99%
See 3 more Smart Citations
“…In this section, we briefly describe the procedure to extract the implied open‐circuit voltage iV oc , ideality factor n id and activation energy E A of perovskite materials from their PL intensity. First, the method to extract iV oc from PL spectra has been described in our previous work 17 . Briefly, using the generalized Planck law, 19,22 the detected intensity at each pixel in the PL image emitted from the sample is given by 17 Ixy_detected=italicSF×B()Eexp()iVocVT, where SF is a scaling factor, which accounts for the fraction of light emission detected by the measurement system, and E is the photon energy.…”
Section: Methods Descriptionsmentioning
confidence: 99%
“…First, the method to extract iV oc from PL spectra has been described in our previous work 17 . Briefly, using the generalized Planck law, 19,22 the detected intensity at each pixel in the PL image emitted from the sample is given by 17 Ixy_detected=italicSF×B()Eexp()iVocVT, where SF is a scaling factor, which accounts for the fraction of light emission detected by the measurement system, and E is the photon energy. B ( E ) is a factor containing the sample's absorptivity and the system's spectral response.…”
Section: Methods Descriptionsmentioning
confidence: 99%
See 2 more Smart Citations
“…[1] Therefore, quantitative imaging techniques are crucial for evaluating device performance, improving manufacturing processes, and assessing device architectures. In particular, spatial imaging techniques help improve PV device reliability, [2] study degradation profiles in emerging PV devices, [3] or can be combined with modeling tools to study local defects and performance of PV devices. [4,5] Further development and investigation of latest silicon cell technologies such as tunnel oxide passivated contact (TOPCon) [6] and interdigitated back-contact (IBC) [6] cells can benefit from advanced spatial characterization techniques, also allowing investigation of degradation mechanisms and defects of established technologies.…”
Section: Introductionmentioning
confidence: 99%