Contactless Vector Network Analysis With Printed Loop Couplers

Abstract

In this paper, an introduction to contactless vector network analysis is given. Furthermore, the implementation of a contactless measurement setup is presented using different printed coupling structures. The coupling structures are connected to a vector network analyzer (VNA) by means of conventional on-wafer probes, as well as planar-coaxial transitions. For the contactless method, conventional calibration algorithms are used to determine the scattering parameters of a device within a complex planar circuit. The contactless measured results are compared to results received with a conventional VNA and to simulation results obtained with a 3-D field simulator. These comparisons show that, especially for small coupling structures of approximately 1 mm, the results correspond well up to 20 GHz.Index Terms-Calibration technique, contactless scattering-parameter measurement, electromagnetic probe, microwave circuit testing, vector network analyzer (VNA).

Signal Integrity Model Extraction Based on Computed Tomography Scans—Analysis of the Required Voxel Resolution

“…In the past, a variety of different measurement methods have been developed to overcome these problems like S-parameter deembedding [1], [2] or contactless methods based on loop couplers [3]- [5] or inductive and capacitive field probes [6], [7]. Each of these methods has different advantages and disadvantages for SI analysis on high-density multilayer boards.…”