1992
DOI: 10.1364/ao.31.006599
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Contouring by electronic speckle pattern interferometry with quadruple-beam illumination

Abstract: We present a new arrangement for contouring by electronic speckle pattern interferometry with four illumination beams, thereby making it unnecessary to move anything during the measurement.Key words: Contouring, interferometry, speckle phenomena, metrology Optical contourin g techniques applie d o n a rough surfac e by mean s o f electroni c speckl e patter n interferometr y (ESPI) hav e bee n develope d fo r three-dimensiona l shap e analysis an d topograph y measurement.1-5 Correlatio n fringes ar e shown af… Show more

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Cited by 2 publications
(1 citation statement)
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“…The contouring surfaces are parallel to the observation direction and the contouring interval once again follows expression (3.41). The tilting of the illumination directions, which is common to all these techniques, can be implemented by use of tilting mirrors or translating lenses [107,108], by switching two sets of fixed illumination beams [109] or by use of tilting diffraction gratings [110]. Large objects have to be illuminated with diverging beams; in that case the tilting can be performed by translating their foci [101], but the effect of the curved wavefront must be corrected [111] for absolute contouring.…”
Section: 331mentioning
confidence: 99%
“…The contouring surfaces are parallel to the observation direction and the contouring interval once again follows expression (3.41). The tilting of the illumination directions, which is common to all these techniques, can be implemented by use of tilting mirrors or translating lenses [107,108], by switching two sets of fixed illumination beams [109] or by use of tilting diffraction gratings [110]. Large objects have to be illuminated with diverging beams; in that case the tilting can be performed by translating their foci [101], but the effect of the curved wavefront must be corrected [111] for absolute contouring.…”
Section: 331mentioning
confidence: 99%