Contrast in transmission X-ray diffraction topographs of growth defects in the core of SrLaGaO₄single crystals

Abstract

Defects in the core of SrLaGaO 4 single crystals, grown by the Czochralski method using a [001]-oriented seed, were studied by transmission X-ray diffraction projection topography. Topographs were taken with radiation from a laboratory source and with high-energy radiation available at the ESRF beamline ID19 in Grenoble. The contrast of the investigated defect images was analysed for various diffraction vectors g and for various values of the product 0 t ( 0 is the linear absorption coefficient and t the crystal thickness). This allowed the contrast formation to be studied as a function of absorption. The results of the analysis confirm the model of crystal lattice deformation around rod-like volume defects in SrLaGaO 4 crystals. research papers J. Appl. Cryst. (2013). 46, 48-54 Agnieszka Malinowska et al. Growth defects in SrLaGaO 4 49

Synchrotron Diffraction topography in Studying of the Defect Structure in Crystals Grown by the Czochralski Method

“…The synchrotron topographic investigations of the Czochralski grown crystals were published by Baruchel et al [29], Malinowska et al [30], Kasper et al [31], Yao et al [32], Muehlberg et al [33], Prokhorov et al [34], Yoneda et al [35] and by Dudley and Yao [36,37]. In the case of the white beam topography the beam coming directly from the synchrotron through the slit system is used as it is schematically shown in Fig.…”