Contribution of surface plasmon decay to secondary electron emission from an Al surface

Werner, Wolfgang; Salvat–Pujol, Francesc; Smekal, Werner; Khalid, Rahila; Aumayr, F.; Störi, H.; Ruocco, Alessandro; Stefani, Giovanni

doi:10.1063/1.3658455

Cited by 27 publications

(30 citation statements)

References 17 publications

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“…Here we discuss how the predictions of the present theoretical approach compare to the results of the recent experiments on Al [15,16]. The kinematical regime of Ref.…”

Section: Theory and Experimentsmentioning

confidence: 88%

“…In coincident measurements of the secondary-electron spectra in Ref. [16], further data were reported for the energy-loss values of 25,30,40,45, and 150 eV.…”

Section: Theory and Experimentsmentioning

confidence: 99%

“…Sec. V is devoted to a comparison of the present theoretical formulation with the recent experimental measurements on Al [15,16]. Finally, conclusions are drawn in Sec.…”

Section: Introductionmentioning

confidence: 99%

“…The measurements in Ref. [16] were carried out for a normal incidence (θ 0 = 0 • ) of the projectile electron with an impact energy of 500 eV.…”

Section: Theory and Experimentsmentioning

confidence: 99%

“…In essence, the (e, 2e) spectroscopy investigates a specific process that, among others, also contributes to the EELS signal: the ejection of a secondary electron induced by the interaction of an impinging, primary electron with the surface. The basic information that one can obtain in this way is as follows: (i) the surface one-electron spin-resolved spectral function [4][5][6][7][8], (ii) the mechanisms of electron-electron collisions at surfaces [9][10][11][12][13][14], and (iii) the surface dielectric function [15][16][17]. Concerning the spectroscopic data on the surface one-electron states, the (e, 2e) method is close to angleresolved photoemission spectroscopy (ARPES) [18,19] because both measure the energies and the wave vectors of the surface electrons.…”

Section: Introductionmentioning

confidence: 99%

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Plasmon-assisted electron-electron collisions at metallic surfaces

Kouzakov

Berakdar

2012

Phys. Rev. A

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We present a theoretical treatment for the ejection of a secondary electron from a clean metallic surface induced by the impact of a fast primary electron. Assuming a direct scattering between the incident, primary electron and the electron in a metal, we calculate the electron-pair energy distributions at the surfaces of Al and Be. Different models for the screening of the electronelectron interaction are examined and the footprints of the surface and the bulk plasmon modes are determined and analyzed. The formulated theoretical approach is compared with the available experimental data on the electron-pair emission from Al.

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“…Here we discuss how the predictions of the present theoretical approach compare to the results of the recent experiments on Al [15,16]. The kinematical regime of Ref.…”

Section: Theory and Experimentsmentioning

confidence: 88%

“…In coincident measurements of the secondary-electron spectra in Ref. [16], further data were reported for the energy-loss values of 25,30,40,45, and 150 eV.…”

Section: Theory and Experimentsmentioning

confidence: 99%

“…Sec. V is devoted to a comparison of the present theoretical formulation with the recent experimental measurements on Al [15,16]. Finally, conclusions are drawn in Sec.…”

Section: Introductionmentioning

confidence: 99%

“…The measurements in Ref. [16] were carried out for a normal incidence (θ 0 = 0 • ) of the projectile electron with an impact energy of 500 eV.…”

Section: Theory and Experimentsmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

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Plasmon-assisted electron-electron collisions at metallic surfaces

Kouzakov

Berakdar

2012

Phys. Rev. A

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Coincidence, Resonant, and High‐Energy Electron Spectroscopies – Resonant Auger, Electron Coincidence for Surface Analysis

Kövér

2015

Encyclopedia of Analytical Chemistry

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Electron spectroscopic methods are powerful and efficient tools for characterization of chemical and electronic structures of surface and interface layers of solids. The electron spectroscopic methods most widely applied for surface chemical analysis, the X‐ray photoelectron spectroscopy (XPS), and Auger electron spectroscopy (AES) are providing information on the elemental composition of the surface and interface layers, as well as on the chemical state of the components. In addition, these techniques can offer possibilities for depth‐resolved and/or laterally resolved analysis in a nondestructive (up to several nanometers depth) or destructive (in combination with ion sputtering, up to several hundred nanometers depth) way. Quantitative surface chemical analytical applications of these methods are greatly helped by physical quantities characterizing electron transport, which can be derived from reflection electron energy loss spectroscopic (REELS) studies of given materials. There are, however, a plenty of opportunities available how to improve the sensitivity, selectivity, and information depth of these techniques. Among these, the coincidence techniques help to identify the physical processes leading to specific structures in the experimental electron spectra, clean up the spectra from unwanted contributions of interfering processes, and limit the depth of analytical information. The resonant excitation can yield unprecedented chemical state selectivity and can greatly improve the detection limit for particular species while providing unique information on the electronic structure in the proximity of the excited atom. High‐energy‐resolution spectroscopy of high‐energy electrons induced by hard X‐rays from solids allows to get an insight into deeper subsurface regions owing to the much increased information depth for energetic electrons, and in addition to the possibility for collecting information on the bulk chemical and electronic structures without interfering effects because of the presence of the surface, this spectroscopy provides a nondestructive access to the chemical state‐resolved composition at deeply buried interfaces. This article intends to give a brief review on selected electron–electron coincidence techniques, resonant Auger electron spectroscopic methods, and high‐energy electron spectroscopic methods, namely, the hard X‐ray photoelectron spectroscopy (HAXPES), focusing on the principle and specific instrumentation of the techniques, the underlying physics of the fundamental processes utilized, the analytical information provided, and important fields of applications. These highly sensitive, selective, and uniquely informative electron spectroscopic methods are expected to be used increasingly in studies of sophisticated novel materials of great practical importance, especially in fields of nanotechnology, micro‐ and nanoelectronics, nano‐biotechnology, nanomedicine, and development of novel solar cells.

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Measurement of the surface excitation parameter of Kapton, polyethylene (PE), polymethyl methacrylate (PMMA), polystyrene (PS) and polytetrafluoroethylene (PTFE)

Werner

Helmberger

Schürrer

et al. 2022

Surface & Interface Analysis

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Reflection electron energy loss spectra (REELS) were measured for five insulating organic compounds: Kapton, polyethylene (PE), poly(methyl methacrylate) (PMMA), polystyrene (PS) and polytetrafluoroethylene (PTFE), as well as for Ni and Si, in the energy range between 200 and 1600 eV. The average number of surface excitations for a single surface crossing were determined from the experimental data and were found to be considerably smaller than for earlier studied materials, which mainly consisted of elemental metals [Surf. Sci. 486(2001)L461]. The surface excitation parameter, a material parameter used to quantify the relative intensity of surface losses in (photo)electron spectroscopy, was extracted from the data and compared with values found in the literature. The results indicate that surface excitations only have a minor influence on quantification of XPS spectra of polymers. On the other hand, a correction for surface excitations turns out to be essential for measurements of the electron inelastic mean free path of polymers when a metal is used as reference material.

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Contribution of surface plasmon decay to secondary electron emission from an Al surface

Cited by 27 publications

References 17 publications

Plasmon-assisted electron-electron collisions at metallic surfaces

Plasmon-assisted electron-electron collisions at metallic surfaces

Coincidence, Resonant, and High‐Energy Electron Spectroscopies – Resonant Auger, Electron Coincidence for Surface Analysis

Measurement of the surface excitation parameter of Kapton, polyethylene (PE), polymethyl methacrylate (PMMA), polystyrene (PS) and polytetrafluoroethylene (PTFE)

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