Accurate
measurement of optical gain is essential to screen materials
as viable active media for thin-film laser applications. The net modal
gain is typically measured using the variable stripe length (VSL)
method, which has been extensively studied for the last few decades.
In this work, we propose an alternative method, which we name scattered
emission profile (SEP) method, to measure the net modal gain. It relies
on the collection of amplified spontaneous emission (ASE) scattered
from the surface of the film illuminated by a pump stripe. By using
an appropriate setup, the new method results in a significantly faster
measurement of net modal gain, while simultaneously providing a more
accurate gain value. The setup and algorithm to extract the net modal
gain are detailed in this paper and are demonstrated on lead halide
perovskite films. The influence of the stripe length on the measured
gain value is shown. Gain measurements performed over two different
perovskite films, fabricated either via spin-coating or thermal evaporation,
confirm the broad applicability of the SEP method. Finally, we show
a quantitative comparison of the SEP method with VSL measurements
and highlight the advantages and shortcomings of each method.