Interfacial
bonding integrity between different materials is critical
to maintain the functionality of the entire physical system in any
scale, ranging from building structures down to semiconductor transistors.
For example, micro-patterned polymers embedded with conductive nanoparticles
[e.g., carbon nanotubes (CNTs)] bonded with integrated circuits have
been applied as many emerging chemical/biological microelectronic
sensors. Nonetheless, it is challenging to measure and ensure the
interfacial bonding integrity between materials for consistent and
sustainable operations. Herein, we apply multiple interface characterization
methods based on micro-engineering and microscopy as an integrative
approach to reveal the mechanism of interfacial reinforcement by adding
CNTs in a matrix material. An epoxy/CNT micro-beam is fabricated onto
a silicon substrate, sandwiching a gold layer as an interfacial precrack.
Superlayers of chromium are then repeatedly deposited onto the microstructure,
inducing stepwise increasing stress over the materials and the corresponding
micro-beam bending after detachment from the bonded interface. Accordingly,
we can quantify key interfacial fracture parameters such as crack
length, steady-state energy release rate, and fracture toughness.
By further examining the formation and distribution of the micro-/nanostructures
along the debonded interface using bright-field microscopy, 3D fluorescence
imaging, and scanning electron microscopy, we can identify the underlying
dominant interfacial strengthening and fracture toughening mechanisms.
We further compare experimental results and theoretical predictions
to quantify the interfacial bonding properties between epoxy/CNT and
silicon and unveil the underlying reinforcement mechanisms. The results
provide insights to develop polymer/nanoparticle composites with reinforced
interfacial bonding integrity for more sustainable and reliable applications
including microelectronics, surface coatings, and adhesive materials.