2007
DOI: 10.1016/j.tsf.2006.09.002
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Control of liquid crystal alignment by deposition of silicon oxide thin film

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Cited by 24 publications
(14 citation statements)
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“…The transmittance of SiON thin film was also enhanced with the increase in deposition temperature. This experimental result was the same that the transmittance of several inorganic thin films could be enhanced with the increase in deposition temperature [12,14].…”
Section: Part 2: Vertical Alignment Of Lc Molecules and Optical Propesupporting
confidence: 75%
See 1 more Smart Citation
“…The transmittance of SiON thin film was also enhanced with the increase in deposition temperature. This experimental result was the same that the transmittance of several inorganic thin films could be enhanced with the increase in deposition temperature [12,14].…”
Section: Part 2: Vertical Alignment Of Lc Molecules and Optical Propesupporting
confidence: 75%
“…In general, it has been reported that inorganic thin film has lower transmittance than organic one. Especially, SiO x thin film, which is one of the most being studied inorganic alignment materials of LCDs, has the disadvantage that the transmittance of SiO x thin film was reduced compared with polyimide [12]. We measured the transmittance of SiON thin film deposited in various temperature and compared with SiO x thin film.…”
Section: Part 2: Vertical Alignment Of Lc Molecules and Optical Propementioning
confidence: 99%
“…In depositions performed from a fixed, highly oblique position (a $ 758-898), columnar thin films align LCs roughly parallel to the n 1 vector, while at moderately oblique angles (a $ 308-708), the alignment is generally parallel to the n 2 vector. [23][24][25][26] This property can be traced to the film porosity, where glancing deposition angles and large pores allow penetration of the LC blend into the film itself and force alignment along the columnar structures. [27,28] At moderate a values, however, the LC blend is restricted to the surface, and tends to align along surface corrugations perpendicular to the deposition plane.…”
Section: Alignment Of Liquid Crystalsmentioning
confidence: 99%
“…1 shows the Bragg-Brentano θ/2θ X-ray diffraction pattern from a TiO 2 sample deposited at a target power of 250 W, substrate bias of − 200 V and oxygen partial pressure of 1 × 10 − 5 Torr. The R(111) peak is observed, as well as an amorphous SiO 2 "bulge"~30° [28,29] from the substrate-film interface. Fig.…”
Section: Water Reductionmentioning
confidence: 92%